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本人DSP新手,刚刚接触,碰到了一个麻烦的问题。
手头有一个合众达的DEC5502的板子,附带光盘里的所有例程是用CCS2.2写成的。手头只有两个仿真器,一个是ICETEK 5100 USB2.0(实质就是XDS510),只支持CCS3.3和CCS4.X;另一个是明伟XDS100V2,支持CCSV4以上版本。
我现在把例程不论是搬到CCS5.2还是CCS3.3上都不能编译通过,都是同一个问题“#55-D too few arguments in macro invocation” ,是CSL_GPT里的一个结构体出的问题。
现在把两个程序都传上来吧,问题应该是同一个,解决一个就行。
最后想顺便问下,我用那个XDS510在3.3下可以连接上目标版,但是另一个XDS100V2在CCS5.2下JTAG始终连接不上是怎么回事呢?(驱动显示已经安装上了)
[Start]
Execute the command:
%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity
[Result]
-----[Print the board config pathname(s)]------------------------------------
C:\Users\YuAnNing\AppData\Local\.TI\1212777678\
0\0\BrdDat\testBoard.dat
-----[Print the reset-command software log-file]-----------------------------
This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 30 2012'.
The library build time was '22:52:27'.
The library package version is '5.0.747.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.
-----[Print the reset-command hardware log-file]-----------------------------
The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).
-----[The log-file for the JTAG TCLK output generated from the PLL]----------
There is no hardware for programming the JTAG TCLK frequency.
-----[Measure the source and frequency of the final JTAG TCLKR input]--------
There is no hardware for measuring the JTAG TCLK frequency.
-----[Perform the standard path-length test on the JTAG IR and DR]-----------
This path-length test uses blocks of 512 32-bit words.
The test for the JTAG IR instruction path-length succeeded.
The JTAG IR instruction path-length is 38 bits.
The test for the JTAG DR bypass path-length succeeded.
The JTAG DR bypass path-length is 1 bits.
-----[Perform the Integrity scan-test on the JTAG IR]------------------------
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0x000000E2.
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0x00000000.
Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0x00000000.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 1
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 2
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 3
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 4
Some of the values were corrupted - 66.5 percent.
The JTAG IR Integrity scan-test has failed.
-----[Perform the Integrity scan-test on the JTAG DR]------------------------
This test will use blocks of 512 32-bit words.
This test will be applied just once.
Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFFFFE0E2.
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 1
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 2
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 3
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 4
Some of the values were corrupted - 66.5 percent.
The JTAG DR Integrity scan-test has failed.
[End] |
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