xds100v2与tms320f29069连接失败的问题求助！

zouzhichao

以下是test connecting：
[Start: Texas Instruments XDS100v2 USB Emulator_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

C:\Users\amobbs\AppData\Local\TEXASI~1\CCS\
    ti\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'May 21 2014'.
The library build time was '17:19:59'.
The library package version is '5.1.507.0'.
The library component version is '35.34.40.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 512 32-bit words.

The test for the JTAG IR instruction path-length succeeded.
The JTAG IR instruction path-length is 38 bits.

The test for the JTAG DR bypass path-length succeeded.
The JTAG DR bypass path-length is 1 bits.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0x3F80F818.
Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0x7F01F03C.
Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0x7F01F078.
Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0x3F80F838.
Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0x7F01F03C.
Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFE03E0F1.
Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0x7F01F062.
Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0x3F80F818.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 3, skipped: 0, failed: 1
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 2
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 3
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 4
Some of the values were corrupted - 59.5 percent.

The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 0
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 0
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 0
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 0
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 0
All of the values were scanned correctly.

The JTAG DR Integrity scan-test has succeeded.

[End: Texas Instruments XDS100v2 USB Emulator_0]

以下是debug弹出的信息:

zouzhichao

自己顶一下

麦田有怪圈

看信息不是仿真器端的问题，查查DSP一端，多数情况是供电或复位

zouzhichao

麦田有怪圈 发表于 2016-6-22 07:37
看信息不是仿真器端的问题，查查DSP一端，多数情况是供电或复位

已经通了，貌似是仿真器与板子不共地造成的
之前仿真器是直接接笔记本，板子是充电器头子供电
今天早上都用笔记本供电就好了…

麦田有怪圈

zouzhichao 发表于 2016-6-22 08:51
已经通了，貌似是仿真器与板子不共地造成的
之前仿真器是直接接笔记本，板子是充电器头子供电
今天早上都 ...

TI的开发工具提示信息相对还算准确，省了很多麻烦。

麦田有怪圈

楼主你太慷慨了，这点小忙不算什么

zouzhichao

麦田有怪圈 发表于 2016-6-23 07:20
楼主你太慷慨了，这点小忙不算什么

莫元还可以再赚，解决问题才是燃眉之急